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A method is presented for direct visualization of electromagnetic microfields. Using a transmission electron microscope equipped with a field-emission electron gun and two electron biprisms, an object wave and two reference waves are superposed to interfere for producing a new type of interference pattern in which electromagnetic fields are directly observed. Equal-potential lines of an electric field around a latex particle and magnetic flux lines emerging from a barium ferrite particle have been observed.
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Hirayama et al. (1995) studied this question.
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