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Layers of Hg1−xCdxTe have been formed by Hg+ ion bombardment of intrinsic CdTe single crystals. Spectral photoresponse measurements indicate a variation in x through the thickness of the Hg1−xCdxTe ranging from x≃0.2, at the surface, to x = 1 corresponding to a bandgap of 0.12 and 1.5 eV, respectively. The material has a conductivity of typically 10−5 (Ω·cm)−1 at 77°K and a 2 μ thickness in the region where x≤0.3.
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N. A. Foss (1968) studied this question.
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