The author describes a versatile frequency-stabilized X-band microwave bridge which uses the cavity perturbation method to measure the temperature dependence of the complex dielectric permittivity of small samples (volume of the order of 1 mm 3 ). Low temperature as well as high temperature experiments can easily be carried out using the same set-up. First results of the temperature-dependent permittivity of PVDP (polyvinylidenefluoride) thin foils are presented.
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Beate Lehndorff (1992) studied this question.
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