We report numerical simulations of typical experimental conditions under which current-voltage (I-V) measurements of resonant-tunneling diodes are conducted. We find that curve tracer measurements can cause bistability and hysteresis in the negative differential resistance (NDR) region. We also find that dc measurements can produce oscillations which distort the shape of the I-V curve. When the series resistance is large, there are three states for a given bias in the NDR region because of the folding of the I-V curve. We believe this phenomenon, extrinsic tristability, to be the source of extrinsic bistability.
No takes yet. Share an insight, caveat, or question.
Jogai et al. (1991) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: