We have studied the influence of the interface roughness on the giant magnetoresistance (GMR) of polycrystalline Fe/Cr superlattices, grown by molecular beam epitaxy on polycrystalline substrates. The interface quality was changed systematically by varying the growth temperature between 0 and 400 ^∘{}C and by the use of a Cr seed layer. X-ray-diffraction spectra, combined with resistivity data, show that a moderate step density at the interfaces can enhance the GMR, whereas interdiffusion and important interface roughness strongly suppress the GMR.
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Beliën et al. (1994) studied this question.
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