The Fresnel diffraction field of plane periodic objects under single TEM 00 mode gaussian beam illumination is studied. Use of the Fresnel-Kirchhoff diffraction formula allows the axial localization and lateral magnification, the basic parameters of the diffraction images, to be determined. The analysed self-imaging phenomenon and the case of uniform beam illumination are compared and discussed.
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Szapiel et al. (1979) studied this question.
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