The dependence of the residual electrical resistivity on sample size has been measured for four single crystals of high-purity aluminum. Measurements were made for several thicknesses of each sample by using a chemical polishing solution to reduce the thickness. The theory of Dingle has been adapted in order to analyze the data. Results give good agreement with the Fuchs-Sondheimer theory of the size effect and give a value for the constant ρbl (bulk resistivity times mean free path) of 7.6×10−12 Ωcm2.
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Kirkland et al. (1971) studied this question.
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