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April 1, 1968International Journal of Electronics

A novel method for the direct determination of the small signal bulk minority carrier lifetime in the middle region of a semiconductor sandwich†

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RBR.J. BassettMoorfields Eye Hospital NHS Foundation TrustCHC. A. HogarthBrunel University of London

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Bassett et al. (1968) studied this question.

synapsesocial.com/papers/6a8a697ee456f7df1bc14295https://doi.org/10.1080/00207216808938027
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