Extended X-ray absorption fine-structure (EXAFS) measurements of evaporated and ion-implanted Fe-Co thin films have been obtained by using the conversion-electron detection technique. Experiments were performed on films 700 AA thick in order to get some structural information which may explain their high resistivity value and unusual behaviour after ion-irradiation. Compared with bulk Fe-Co, the electron-beam-evaporated sample yields a damping of the EXAFS signals. The authors show that this effect is correlated to the nanocrystalline character of the sample so obtained. A quantitative analysis provides an estimation of the grain boundary fraction. Electrical resistivity and EXAFS results suggest that implantations of Fe-Co nanocrystals with heavy ions locally smooth out the insulating effect of the grain boundary but increase the damage produced in the crystalline structure.
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Jaouen et al. (1990) studied this question.
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