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November 1, 1995Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

Thermomechanical analysis of failure of metal field emitters

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MAMario G. AnconaCentro de Investigación y Proyectos en Ambiente y Desarrollo

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Cite This Study

Mario G. Ancona (1995) studied this question.

synapsesocial.com/papers/6a8a73c0eeed409805de8b09 https://doi.org/10.1116/1.588105

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