Thickness dependence (over the range d=1.05 to 0.02 μm) of the coercive electric fields, Ec, of niobium-doped lead-zirconium-titanate (PNZT) films has been investigated in pulsed laser ablated c-axis-oriented PNZT/YBa2Cu3O7−x heterostructures deposited on LaAlO3 substrates. Our studies show that Ec has a d−2/3 dependence in good agreement with the domain nucleation model developed for ferroelectric single crystals by Kay and Dunn [Philos. Mag. 7, 2027 (1962)]. Reproducible structural properties as well as ferroelectric properties with rather high polarization which is independent of the film thickness have been obtained in these Nd:YAG pulsed laser ablated films.
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Björmander et al. (1995) studied this question.