Scanning force microscopy (SFM) has been used to probe the local polarization state and piezoelectric properties of ferroelectric films. The conductive SFM tip was employed as a movable top electrode to detect the piezoresponse in the film induced by an ac voltage. Our measurements reveal a spatial dependence of the piezoelectric properties of individual grains of virgin ferroelectric films. A maximum effective piezoelectric coefficient of 5.5 pm/V has been detected in the lead-free CaBi 4 Ti 4 O 15 film.
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Fu et al. (2002) studied this question.
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