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The electrical resistivities of arc-evaporated carbon films were studied. The resistance has a large negative temperature coefficient. The annealing diminishes remarkably both the resistance and its temperature dependency. The specific resistivity depends on the film thickness and increases rapidly below 500Å. It seems that the lattice imperfections play the most important role, and then from the annealing curve, their distributions are discussed. The aging effect on the resistance were also measured.
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Toyoda et al. (1959) studied this question.
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