Remote electron beam induced current (REBIC) measurements have been carried out to investigate electrically active regions in YBa2Cu3O7−x single crystals. Enhanced REBIC contrast, found in growth steps and other topographic features of the samples, is discussed in terms of charged oxygen-related defects. The capability of REBIC to image structural inhomogeneities caused by strain or plastic deformation in these crystals is also established. Charge carrier diffusion length has been estimated at different temperatures from REBIC linescan profiles.
No takes yet. Share an insight, caveat, or question.
Dı́az-Guerra et al. (1997) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: