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March 1, 1953Journal of Applied Physics

On the New Method of Measuring Dielectric Constant and Loss Angles of Semiconductors

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BIBunjirō IchijōShizuoka University

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Bunjirō Ichijō (1953) studied this question.

synapsesocial.com/papers/6a8aa3cea90c2f4c44fbc8ce https://doi.org/10.1063/1.1721270

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