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January 1, 1983IEE Proceedings I Solid State and Electron Devices

Measurement of thermal transients in semiconductor power devices and circuits

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PWPaul W. WebbUniversity of South Florida

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Paul W. Webb (1983) studied this question.

synapsesocial.com/papers/6a8ab71a5c716ca1a5d483behttps://doi.org/10.1049/ip-i-1.1983.0028
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