Resonant Raman scattering and inner-shell hole widths in Cu, Zn and Ho

The spectral distribution and integrated intensity of resonant Raman scattering was measured with tunable synchrotron radiation in the vicinity of the K edges of Cu and Zn and L III edge of Ho. The assumption of a constant density of final states is adequate to describe the cross section more than 5-10 eV below the absorption edges. Despite the poor energy resolution afforded by a solid state detector the lifetime width of the inner-shell hole was determined to within a fraction of an electron volt. In the case of the L shell especially, the sub-shell widths can be measured individually in a straightforward low-resolution experiment. The result of 4.8+or-0.2 eV for the Ho 2p 3/2 level is much closer to the predicted value of 4.0 eV than widths obtained from absorption edge spectroscopy.