Elliptical spin precession correction factor in the theory of spin‐wave resonance

Ellipticity of spin precession is analysed for its relevance to the microscopic theory of spin‐wave resonance. Applying the surface inhomogeneity model of a thin film with surface anisotropy described in terms of an effective pinning field, it is shown that elliptical spin precession gives rise to a correction factor in the resonance line intensity formula dependent only on the frequency of the microwave field and the orientation of the static field with respect to the film surface.