Apparatus and Techniques for Practical Chemical Identification by X-Ray Diffraction

The method of chemical identification by means of x-ray diffraction is reviewed from the point of view of apparatus and techniques recently made commonly available, with particular emphasis on the use of long wave-length x-radiation. Experience in using the A.S.T.M. card index file of x-ray diffraction data is reported. The discussion is designed especially for the person who wishes to make use of this important analysis tool but who is not an expert in x-ray diffraction.