Glancing‐incidence x‐rays provide a wealth of possibilities for the analysis of thin layers and multilayers. This paper discusses reflectometry under both specular and non‐specular conditions, and also the combination with angle‐dependent x‐ray fluorescence. From these measurements information can be obtained on layer thickness, interface quality and compositional depth profile. First the historical development of glancing‐incidence x‐ray analysis is sketched. Then the physical principles of the interaction of glancing‐incidence x‐rays with samples which may contain rough interfaces are discussed. The equipment, which allows for both x‐ray fluorescence and reflectivity measurements, is also described. The possibilities are illustrated with a number of examples from the literature.
No takes yet. Share an insight, caveat, or question.
Boer et al. (1995) studied this question.
Synapse has enriched 4 closely related papers on similar clinical questions. Consider them for comparative context: