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This paper proposes an indoor procedure based on charge‐coupled device camera measurements to characterize the non‐uniform light patterns produced by optical systems used in concentration photovoltaic (CPV) systems. These irradiance patterns are reproduced on CPV solar cells for their characterization at concentrated irradiances by using a concentrator cell tester and placing high‐resolution masks over the cells. Measured losses based on the masks method are compared with losses in concentrator optical systems measured by using the Helios 3198 solar simulator for CPV modules.
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Herrero et al. (2011) studied this question.
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