A heat-pulse technique for the simultaneous determination of specific heats and thermal diffusivities of thin-film samples at low temperatures is discussed. In addition, correction formulae are provided to account in the analyses for various departures from ideal experimental conditions. An analysis of the limits of the technique suggests that heat capacities as small as 10 -11 J K -1 can be measured.
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Cruz-Uribe et al. (1982) studied this question.
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