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January 1, 2008International Journal of PhotoenergyOpen Access

Photoelectrochemical Characterization of Sprayed α‐Fe2O3 Thin Films: Influence of Si Doping and SnO2 Interfacial Layer

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Authors

YLYongqi LiangXihua UniversityCECristina S. EnacheRKRoel van de KrolHelmholtz-Zentrum Berlin für Materialien und Energie

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Liang et al. (2008) studied this question.

synapsesocial.com/papers/6a8afcdbe6afc07dcbf44bf7https://doi.org/10.1155/2008/739864
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