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We have made measurements of the temperature and angular dependence of the critical field for superconductivity in thin-film specimens of Al:Al₂{O}₃$ composites. The measurements lead us to infer that these specimens are composed of one or more layers with thicknesses between the grain size and the overall film thickness. This inference is corroborated by measurements of the fluctuation conductivity. Preliminary data on Al:Te composite films suggest that nonrandom structures of similar scale are also present in this material.
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Dodds et al. (1986) studied this question.
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