Our former investigation for the effects of localization on the superconducting critical temperature of thin films are extended to much dirty cases where τ -1 ≫ω D , ω D being the Debye frequency, but still in the weakly localized regime, i.e. \(/(2π EFτ){<}1\), E F and τ being the Fermi energy and the life time, respectively. The depression of the critical temperature to the first order in \(/(2π EFτ)\) is shown to be proportional to the inverse of the film thickness, 1/ d , i.e. to the sheet resistance \(R_{}\), in the wide range of the thickness within the present region of interest where \(√{ D/kBT}{}d{}l\), D being the diffusion constant, T the temperature and l the mean free path. The proportionality factor depends on the details of the interaction processes among electrons.
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Ebisawa et al. (1985) studied this question.
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