An investigation of the fine structure of X-ray interferograms

The fine structure of X-ray moiré patterns, formed in various interference patterns are studied. The nature of fine structure formation in dependence on the magnitude and on the kind of crystal distortion is investigated. It is shown that the fine stucture fringe spacing strictly depends on the relative variance of net plane spacing and the fringes are inclined with respect to the normal of the plane by an angle, which depends on the magnitude of the local lattice rotations. A new method for determining lattice distortions by means of such fringes is indicated.