Odd‐order probe correction technique for spherical near‐field antenna measurements

In this paper, an odd‐order probe for spherical near‐field antenna measurements is defined. A probe correction technique for odd‐order probes is then formulated and tested by computer simulations. The probe correction for odd‐order probes is important, since a wide range of realistic antennas belongs to this class. To the authors' knowledge, the proposed technique is the first practical high‐order probe correction technique that has been formulated in detail, has been tested, and has been shown to work.