Author: Strecker, A. et al.; Genre: Journal Article; Issued: 2003; Keywords: MPI für Metallforschung; Abt. Rühle; ZWE Hochspannungs-Mikroskopie; ; Title: Progress in the preparation of cross-sectional TEM specimens by ion-beam thinning
No takes yet. Share an insight, caveat, or question.
Strecker et al. (2003) studied this question.
Synapse has enriched one closely related paper. Consider it for comparative context: