A method for determining the beam overlap integral semiautomatically in a merging beams experiment is presented. The apparatus consists of a driven beam scanner and an analog circuit which computes two-dimensional overlap integrals from the sampled beam currents. Only a simple additional computation is required to obtain the three-dimensional overlap integral. Results of qualitative and quantitative tests demonstrate the validity of the technique. The capability for rapid measurement of beam overlap is employed to investigate the stability of the overlap integral.
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Nitz et al. (1976) studied this question.
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