X-ray stress measurement from an imperfect Debye–Scherrer ring

A technique to measure the stress from an imperfect Debye–Scherrer ring is reported. In a previous work, the authors reported a technique to calculate the stress from the Fourier series of a normal strain of a Debye–Scherrer ring and suggested that it is possible to calculate the stress from an imperfect Debye–Scherrer ring if the Fourier series is obtained. The present work presents a technique to calculate the Fourier series of an imperfect Debye–Scherrer ring. Industrially, this is important because the object of interest is often covered by other objects or engraved. The aim of this work is to develop a technique that extends the application range of the X-ray stress measurement.