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Exact expressions for the distributions of the intertetrahedral (Si-O-Si) angles θ and the dihedral angles δ in vitreous SiO2 have been derived by assuming a minimum oxygen-oxygen distance between neighbouring tetrahedra. The model produces a very good fit to the experimental distribution of θ (Mozzi and Warren 1969), and predicts a modestly non-random distribution for δ.
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F. L. Galeener (1985) studied this question.
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