The optical properties of polyetherimide resin as described by the complex index of refraction, N = n ‐ ik, are derived by Kramers‐Kronig analysis of experimental absorption and reflectance data obtained in the range 40 μm ≥ λ ≥105 nm. Potential uses of this polymer as a printed circuit board material and as a packaging medium for microelectronic circuitry and the relevance of optical data in laser‐assisted processing schemes used in these and other applications are briefly discussed.
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Philipp et al. (1989) studied this question.
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