A new method for determining optical constants n and k , for thin absorbing films supported by a dielectric substrate, has been devised. Measurement of the ratio of two reflection coefficients R parallel / R perpendicular is made at two angles of incidence, and the film thickness d is determined independently. Optimum angles of incidence for experimental measurement have been determined for 1·0less-than-or-eq, slant n less-than-or-eq, slant4·0 and 1·0less-than-or-eq, slant k less-than-or-eq, slant4·0 for many optical film thicknesses d /λ in the range 0·01less-than-or-eq, slant d /λless-than-or-eq, slant0·25. The method, when used at these optimum angles, yields n and k accurate to ±0·05 for values of d /λgt-or-equal, slanted0·05, providing angles are measured to better than ±0·1°, reflection ratios are measured to better than ±0·01 and values of d /λ are measured to better than ±0·005.
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Miller et al. (1971) studied this question.