The collective electronic excitations in Al thin films with thickness down to mono-atomic layer were studied by scanning tunneling microscopy and angle-resolved high resolution electron energy loss spectroscopy. Clear evidences for a coupling of the Al surface plasmon and Al/Si interface plasmon were observed for the film thickness below 3 ML, which induces a splitting of the normal Al surface plasmon mode. The experimental results can be well explained by a classical model for surface plasmon excitations.
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Qin et al. (2013) studied this question.
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