This letter describes techniques for measurement of widths of subnanosecond pulses at 10.6μ obtained from mode-locked high-pressure CO2 lasers. Two novel linear correlation techniques are proposed. These are based upon (1) the effect of photon flux on free carriers in semiconductors and (2) a fast shutter produced in a semiconductor.
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C. K. N. Patel (1971) studied this question.
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