Total Electron Backscatter and Backemission Yields from Metals Bombarded at Several Angles by 0.4 to 1.4 MeV Electrons

Total high energy electron backscatter yields and low energy secondary electron yields have been measured for aluminum, copper and tantalum. Primary high energy electrons were incident at angles of 0°, 15°, 30°, 45°, 60°, and 75° from the surface normal. A new experimental measuring apparatus has been developed and tested to measure total electron yields from irradiated materials. This device is relatively free of the problems associated with electron emission from the device itself.