The total integrated reflectivity of a slightly rough dielectric surface is studied by the Rayleigh-Rice method. Special emphasis is laid on the correct second-order terms of the perturbation expansion; this is important for correlation lengths of the surface structure comparable to the wavelength. The main effects of a surface roughness of this kind are reflection loss, shift of the Brewster angle to smaller values, and slight reddening of the scattered light.
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R. Schiffer (1987) studied this question.
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