Lutetium metal and several Lu(H) solid solutions are irradiated with electrons in the energy range 0·4 to 1·7 MeV at liquid-helium temperatures. The threshold energy for the displacement of a Lu atom is determined to Td = (17 ± 1) eV, corresponding to an incident electron energy of Ed = (780 ± 30) keV. Displacement cross sections are fitted to the experimental data, with ϱ ≈︁ (60 to 90) μΩ cm/at% F.P. as Frenkel-pair resistivity. The defect production rates at 0·4 MeV of Lu(H) depend on the H-concentration in the α-phase. From their fluence dependence, the concentration dependent defect formation cross sections, σH = (2.35 to 4.18) × 106 barns, are deduced and the defect resistivities, ΔϱH = (36 to 41) μΩ cm/atom H. A comparison with calculated electron-hydrogen scattering cross sections permits to determine a threshold energy for the H-defect formation, TH = (0.06 to 0·09) eV, which, consequently, also varies with the H-concentration. A possible model assuming a paired hydrogen configuration as the stable low-resistivity form at low temperatures is suggested.
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Daou et al. (1977) studied this question.
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