We experimentally tested a novel method for measuring the resistivity tensor components of a conducting slab in a magnetic field. In this method the conductance properties of an arbitrarily shaped flat conductor are studied with a number of four-terminal resistance measurements. Under the assumption that single values for the resistivity and for the Hall coefficient hold for the entire sample, we use part of the obtained data to derive a description of the conductance properties of the sample. Then the remaining independent data are used to check the validity of this assumption. Experimental details of the method are given, and its application to aluminum, germanium, epitaxial gallium arsenide, and a GaAs/(Al,Ga)As heterostructure is discussed. It is found that with the novel method it is possible to observe effects of the contacts, the sample periphery, and material inhomogeneities.
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Haaren et al. (1988) studied this question.
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