A new system for low-energy electron diffraction (LEED) intensity measurements has been developed using a video camera and digital processing of the video signal. Complete two-dimensional LEED patterns are digitized in real time with high resolution using a commercial video processor. Intensity-voltage (I-V) data on all beams in complex LEED patterns are collected simultaneously. A microcomputer analysis program automatically tracks the diffraction beams as a function of energy and calculates beam position, size, and integrated intensity, including a local background correction. Using a video tape recorder for intermediate data storage, a complete set of I-V curves can be collected in less than 100 s.
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Ogletree et al. (1986) studied this question.
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