Molecular dynamics and quasidynamics simulations, utilizing the Tersoff many-body potential, were used to investigate projectile incorporation and defect production as well as lattice relaxation, diffusion, and annihilation of defects resulting from 50 eV Si irradiation of (2×1)-terminated Si(001). A unity trapping probability, in sites distributed between the epitaxial overlayer and the fourth lattice layer (l=4), was obtained for Si projectiles irradiating an array of high- and low-symmetry points in the primitive surface unit cell. Exchange epitaxy events were observed in which a lattice atom came to rest at an epitaxial (1×1) bridge site while the projectile stopped in a substitutional lattice site. In addition, several collision sequences resulted in the opening of additional dimers, up to four per irradiation event, thus providing (1×1) sites for migrating adatoms during ion-assisted crystal growth. The primary residual lattice defects produced were split and hexagonal interstitials, although tetragonal, bond-centered, and pentagonal interstitials were also produced in layers l=2 through l=14 with the average interstitial layer depth
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Kitabatake et al. (1993) studied this question.
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