Intensity variation on thermal diffuse scattering (TDS) in the Si 111 Bragg reflection was studied using a 57Fe synchrotron Mössbauer source. The observed TDS diffraction curve showed an intensity anomaly depending on the beam incident angles, and was qualitatively interpreted as dynamical effects on the Si perfect crystal including the angular dependencies on the X-ray wave fields and extinction distance in the crystal.
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Mitsui et al. (2022) studied this question.
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