Impedance Relaxation Spectrum Analysis of Oxidized Silver Electrodes

The real and imaginary parts of the impedance of the oxidized silver electrode in solutions have been measured in a frequency range of . When the electrode is oxidized at a potential when only is formed, we were able to isolate three passive elements: the high frequency capacitance and the high and low frequency resistances. On further oxidation, at a potential in which can be formed, we were able to isolate five passive elements: two capacitive and three resistive. Two of these elements were identified as originating from the layer. The functional dependence of all these elements on the amount of charge that is used for oxidation reveals that the layer can be analyzed in terms of a single dielectricum in a parallel‐plate capacitor. Parameters such as thickness of the layer, resistivity of the material, and roughness factor could be evaluated. We have found that at the potential in which is formed, a significant fraction of the charge is used for the formation of .