The aberrations and with that the systematic corrections for a single crystal diffractometer measurement according to the BOND method are derived from one general expression in a closed analytic way. Thus, all possible effects are included and calculated correctly. In comparison with the hitherto existing seperate derivation of aberrations it appears that the results of already known aberrations change in some cases and new aberrations appear. On this basis it is possible to measure lattice parameters as well as wavelengths with accuracies in the order of 10−7d and 10−7λ, respectively, on a BOND diffractometer.
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Härtwig et al. (1989) studied this question.
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