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Using X-ray and neutron radiography and tomography, images of material and component inhomogeneities and their development with time can be obtained. Due to their non-destructiveness and non-invasive nature both methods give insight into the function of devices and their decay processes. Fundamentals of X-ray and neutron radiography and tomography are briefly outlined, examples for both techniques are given, their complementarities are highlighted and emerging techniques and frontiers are discussed.
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Banhart et al. (2010) studied this question.
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