Two problems greatly affect the use of capability indices such as Cₚ , Cₚₖ and Cₚₖₘ : the lack of affinity with the process fraction defective π and the difficulty of dealing with the sampling distributions of their natural estimators. In this paper, a capability index which is in one‐to‐one correspondence with π is introduced and simple inferential procedures under a Bayesian perspective are developed to facilitate its use in industrial applications.
No takes yet. Share an insight, caveat, or question.
Borges et al. (2001) studied this question.
Synapse has enriched 2 closely related papers on similar clinical questions. Consider them for comparative context: