We describe a simple graphical method for measuring film thickness by XPS, which we call a Thickogram. This method can be used even when the film and substrate peaks have very different kinetic energies and incorporates the effects of elastic scattering within the recommended range of take-off angles. The Thickogram may also be useful when measuring film thickness by AES, though this is less commonly required than in XPS.
No takes yet. Share an insight, caveat, or question.
Peter J. Cumpson (2000) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: