An instrument is described which relates magnetization vector position in a thin film to rf mixing behavior under a crossed-wire probe. The high sensitivity possible with tuned rf amplification permits nondestructive observation of small areas of the film and affords an angular resolution on the order of one-tenth degree. Accurate location of the film easy axis and direct indication of magnetization vector rotation under the influence of a static field are obtained.
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Bader et al. (1962) studied this question.
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