This paper reviews some recent achievements of synchrotron radiation XPS microscopy in the characterization of surfaces and interfaces of morphologically complex and multiphase materials. Using selected results obtained with the scanning photoelectron microscope built at the synchrotron light source ELETTRA in Trieste, the novel information provided by combining chemical sensitivity with submicron spatial resolution is presented.
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М. Кискинова (2000) studied this question.
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