A back-to-back measurement method for characterizing phased-array antennas is described. The method yields the complex active impedance of an antenna in a large phased array at any desired frequency and scan angle without the need of a feed network to excite the antenna under test. This avoids the cost and de-embedding procedure associated with the feed network. Measurements are performed by using two different transmission networks to connect identical arrays in a back-to-back configuration. The new method is particularly well suited to printed antennas and is illustrated by using tapered-slot antennas. Back-to-back measurements in waveguide simulators compare well to traditional waveguide simulator measurements and measurements in an anechoic chamber compare well to results from computer codes based on the full-wave method of moments.
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Chang et al. (2000) studied this question.
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